JEOL7800F Field Emission Electron Microscope (FESEM)
Model: JEOL7800F
Description: High-resolution field-emission SEM for nanoscale imaging and analytical characterization.
Function: Surface morphology imaging; compositional contrast imaging; microstructural analysis.
Features: Schottky field emission gun; sub-nanometer resolution; low-voltage imaging; in-lens and chamber detectors; compatible with EDS and EBSD.
Contact:
- Unit: Integrated Nanosystems Development Institute
- Campus: Indianapolis
- Resource Type: Equipment
- Contact Name: Dipak Maity
- Contact Email: maityd@iu.edu
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